arXiv · 2211.06954
Interlacing in atomic resolution scanning transmission electron microscopy
Abstract
Fast frame-rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling electron beam dose, capturing in-situ events or reducing the appearance of scan distortions. Whilst several strategies exist for increasing frame-rates, many impact image quality or require investment in advanced scan hardware. Here we present an interlaced imaging approach to achieve minimal loss of image quality with faster frame-rates that can be implemented on many existing scan controllers. We further demonstrate that our interlacing approach provides the best possible strain precision for a given electron dose compared with other contemporary approaches.
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Jonathan J. P Peters, Tiarnan Mullarkey, James A. Gott, Elizabeth Nelson, Lewys Jones. 2022-11-13. Interlacing in atomic resolution scanning transmission electron microscopy. https://doi.org/10.1093/micmic%2Fozad056
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