arXiv · 2301.09478
Photoluminescence imaging of single photon emitters within nanoscale strain profiles in monolayer WSe$_2$
Abstract
Local deformation of atomically thin van der Waals materials provides a powerful approach to create site-controlled chip-compatible single-photon emitters (SPEs). However, the microscopic mechanisms underlying the formation of such strain-induced SPEs are still not fully clear, which hinders further efforts in their deterministic integration with nanophotonic structures for developing practical on-chip sources of quantum light. Here we investigate SPEs with single-photon purity up to 98% created in monolayer WSe$_2$ via nanoindentation. Using photoluminescence imaging in combination with atomic force microscopy, we locate single-photon emitting sites on a deep sub-wavelength spatial scale and reconstruct the details of the surrounding local strain potential. The obtained results suggest that the origin of the observed single-photon emission is likely related to strain-induced spectral shift of dark excitonic states and their hybridization with localized states of individual defects.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Artem N. Abramov, Igor Y. Chestnov, Ekaterina S. Alimova, Tatiana Ivanova, Ivan S. Mukhin, Dmitry N. Krizhanovskii, Ivan A. Shelykh, Ivan V. Iorsh, Vasily Kravtsov. 2023-01-23. Photoluminescence imaging of single photon emitters within nanoscale strain profiles in monolayer WSe$_2$. https://doi.org/10.1038/s41467-023-41292-9
Cite the original work for its findings. Save a collection to share your selection of sources.