Measurement of the 2$\nu\beta\beta$ Decay Half-Life of Se-82 with the Global CUPID-0 Background Model

O. Azzolini; J. W. Beeman; F. Bellini; M. Beretta; M. Biassoni; C. Brofferio; C. Bucci; S. Capelli; V. Caracciolo; L. Cardani; P. Carniti; N. Casali; E. Celi; D. Chiesa; M. Clemenza; I. Colantoni; O. Cremonesi; A. Cruciani; A. D'Addabbo; I. Dafinei; S. Di Domizio; V. Dompè; G. Fantini; F. Ferroni; L. Gironi; A. Giuliani; P. Gorla; C. Gotti; G. Keppel; J. Kotila; M. Martinez; S. S. Nagorny; M. Nastasi; S. Nisi; C. Nones; D. Orlandi; L. Pagnanini; M. Pallavicini; L. Pattavina; M. Pavan; G. Pessina; V. Pettinacci; S. Pirro; S. Pozzi; E. Previtali; A. Puiu; A. Ressa; C. Rusconi; K. Schäffner; C. Tomei; M. Vignati; A. S. Zolotarova

arXiv · 2306.14654

Measurement of the 2$\nu\beta\beta$ Decay Half-Life of Se-82 with the Global CUPID-0 Background Model

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Abstract

We report on the results obtained with the global CUPID-0 background model, which combines the data collected in the two measurement campaigns for a total exposure of 8.82~kg$\times$yr of $^{82}$Se. We identify with improved precision the background sources within the 3 MeV energy region, where neutrinoless double $\beta$-decay of $^{82}$Se and $^{100}$Mo is expected, making more solid the foundations for the background budget of the next-generation CUPID experiment. Relying on the excellent data reconstruction, we measure the two-neutrino double $\beta$-decay half-life of $^{82}$Se with unprecedented accuracy: $T_{1/2}^{2\nu} = [8.69 \pm 0.05 \textrm{(stat.)}~^{+0.09}_{-0.06} \textrm{(syst.)}] \times 10^{19}~\textrm{yr}$.

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O. Azzolini, J. W. Beeman, F. Bellini, M. Beretta, M. Biassoni, C. Brofferio, C. Bucci, S. Capelli, V. Caracciolo, L. Cardani, P. Carniti, N. Casali, E. Celi, D. Chiesa, M. Clemenza, I. Colantoni, O. Cremonesi, A. Cruciani, A. D'Addabbo, I. Dafinei, S. Di Domizio, V. Dompè, G. Fantini, F. Ferroni, L. Gironi, A. Giuliani, P. Gorla, C. Gotti, G. Keppel, J. Kotila, M. Martinez, S. S. Nagorny, M. Nastasi, S. Nisi, C. Nones, D. Orlandi, L. Pagnanini, M. Pallavicini, L. Pattavina, M. Pavan, G. Pessina, V. Pettinacci, S. Pirro, S. Pozzi, E. Previtali, A. Puiu, A. Ressa, C. Rusconi, K. Schäffner, C. Tomei, M. Vignati, A. S. Zolotarova. 2023-06-26. Measurement of the 2$\nu\beta\beta$ Decay Half-Life of Se-82 with the Global CUPID-0 Background Model. https://arxiv.org/abs/2306.14654

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