Measurements of time resolution of the RD50-MPW2 DMAPS prototype using TCT and $^{90}\mathrm{Sr}$

J. Debevc; M. Franks; B. Hiti; U. Kraemer; G. Kramberger; I. Mandić; R. Marco-Hernández; D. J. L. Nobels; S. Powell; J. Sonneveld; H. Steininger; C. Tsolanta; E. Vilella; C. Zhang

doi:10.1088/1748-0221/19/05/p05068

arXiv · 2312.01793

Measurements of time resolution of the RD50-MPW2 DMAPS prototype using TCT and $^{90}\mathrm{Sr}$

J. Debevc·M. Franks·B. Hiti·U. Kraemer·G. Kramberger·I. Mandić·R. Marco-Hernández·D. J. L. Nobels·S. Powell·J. Sonneveld·H. Steininger·C. Tsolanta·E. Vilella·C. Zhang

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Abstract

Results in this paper present an in-depth study of time resolution for active pixels of the RD50-MPW2 prototype CMOS particle detector. Measurement techniques employed include Backside- and Edge-TCT configurations, in addition to electrons from a $^{90}\mathrm{Sr}$ source. A sample irradiated to $5\cdot 10^{14}\,\mathrm{n}_\mathrm{eq}/\mathrm{cm}^2$ was used to study the effect of radiation damage. Timing performance was evaluated for the entire pixel matrix and with positional sensitivity within individual pixels as a function of the deposited charge. Time resolution obtained with TCT is seen to be uniform throughout the pixel's central region with approx. $220\,\mathrm{ps}$ at $12\,\mathrm{ke}^-$ of deposited charge, degrading at the edges and lower values of deposited charge. $^{90}\mathrm{Sr}$ measurements show a slightly worse time resolution as a result of delayed events coming from the peripheral areas of the pixel.

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J. Debevc, M. Franks, B. Hiti, U. Kraemer, G. Kramberger, I. Mandić, R. Marco-Hernández, D. J. L. Nobels, S. Powell, J. Sonneveld, H. Steininger, C. Tsolanta, E. Vilella, C. Zhang. 2023-12-04. Measurements of time resolution of the RD50-MPW2 DMAPS prototype using TCT and $^{90}\mathrm{Sr}$. https://doi.org/10.1088/1748-0221%2F19%2F05%2Fp05068

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