Development of a high-frequency dielectric spectrometer using a portable vector network analyzer

Aitor Erkoreka; Josu Martinez-Perdiguero

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arXiv · 2402.00498

Development of a high-frequency dielectric spectrometer using a portable vector network analyzer

Aitor Erkoreka·Josu Martinez-Perdiguero

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Abstract

A simple and novel setup for high-frequency dielectric spectroscopy of materials has been developed using a portable vector network analyzer. The measurement principle is based on radio-frequency reflectometry, and both its capabilities and limitations are discussed. The results obtained on a typical liquid crystal prove that the device can provide reliable spectra between $10^7$ Hz and $10^9$ Hz, thus extending the capabilities of conventional impedance analyzers.

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Aitor Erkoreka, Josu Martinez-Perdiguero. 2024-02-01. Development of a high-frequency dielectric spectrometer using a portable vector network analyzer. https://arxiv.org/abs/2402.00498

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