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arXiv · 2502.07326

PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe Microscopy

Ziwei Wei·Shuming Wei·Qibin Zeng·Wanheng Lu·Huajun Liu·Kaiyang Zeng
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Abstract

We have developed a Parallel Integrated Control and Training System, leveraging the deep reinforcement learning to dynamically adjust the control strategies in real time for scanning probe microscopy techniques.

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Ziwei Wei, Shuming Wei, Qibin Zeng, Wanheng Lu, Huajun Liu, Kaiyang Zeng. 2025-02-11. PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe Microscopy. https://arxiv.org/abs/2502.07326

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