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arXiv · 2606.12625

Lock-In Infrared Thermography: Phase Analysis for Rapid, Wide-Range Thermal Conductivity Measurements

Ethan A. Scott·Jeffrey L. Braun·Jessica Reyes·Bruce Bolliger·Terrence Soares·John T. Gaskins·Marko J. Tadjer·Patrick E. Hopkins
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Abstract

We report on a phase-based lock-in thermography approach, combined with a multilayered thermal model (often employed in thermoreflectance analysis), to measure the thermal conductivity of bulk materials and layered structures. The spatial distribution of the material's thermal phase is monitored with an infrared camera, which is locked into the frequency of a modulated laser used to heat the material. This phase distribution is then fit with a thermal model, in which properties such as thermal conductivity are extracted as fit parameters. This approach enables non-contact, front-side measurements, which are insensitive to surface roughness. The technique does not strictly require the application of a transducer layer, but we highlight the practical benefits of applying a removable adhesive layer to serve as a near-surface absorber. We demonstrate the efficacy of the method by measuring materials with thermal conductivities that span over three orders of magnitude (approximately 1 W/m/K to > 2000 W/m/K).

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Ethan A. Scott, Jeffrey L. Braun, Jessica Reyes, Bruce Bolliger, Terrence Soares, John T. Gaskins, Marko J. Tadjer, Patrick E. Hopkins. 2026-06-10. Lock-In Infrared Thermography: Phase Analysis for Rapid, Wide-Range Thermal Conductivity Measurements. https://arxiv.org/abs/2606.12625

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