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arXiv · 2608.24919

Comparative measurements of DC electrical breakdown distributions in liquid nitrogen, liquid helium, and liquid argon

N. S. Phan·S. M. Clayton·R. Gautam·T. M. Ito·L. Kadlec·C. M. O'Shaughnessy·T. J. Schaub
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Abstract

We present a comparative study of DC electrical breakdown in liquid nitrogen, liquid helium, and liquid argon using a common cryostat, electrode assembly, voltage-ramp protocol, and analysis procedure. This common experimental configuration minimizes systematic differences that often complicate comparisons among cryogenic liquids, including variations in electrode geometry, stressed area, surface finish, and gap spacing. For each liquid, breakdown was characterized as a statistical distribution rather than by a single characteristic voltage, allowing the stochastic nature of the process to be examined. Measurements were performed both near saturated vapor pressure and under modest pressurization to assess the influence of bubble formation and related thermodynamic effects. Liquid argon exhibited a non-stationary "turn-on" behavior, with breakdown voltage increasing over repeated discharges, consistent with evolution of the local impurity environment or electrode surface state. Near saturated vapor pressure, liquid helium showed a bimodal breakdown distribution, with a lower-field component consistent with bubble-mediated processes. Liquid nitrogen exhibited higher breakdown fields than liquid argon and fields comparable to those measured in pressurized liquid helium, within the observed run-to-run variation associated with surface state. Taken together, these results support a comparative framework in which breakdown strength reflects both thermodynamic stability against bubble formation and the transport properties of the dominant negative charge carrier.

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N. S. Phan, S. M. Clayton, R. Gautam, T. M. Ito, L. Kadlec, C. M. O'Shaughnessy, T. J. Schaub. 2026-08-13. Comparative measurements of DC electrical breakdown distributions in liquid nitrogen, liquid helium, and liquid argon. https://arxiv.org/abs/2608.24919

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