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arXiv · 2609.04655

4 MV/cm (010) $\beta$-Ga$_2$O$_3$ Heterojunction Diodes Realized by Low-Damage e-Beam NiO$_x$ Interlayers

Carl Peterson·Yizheng Liu·Chinmoy Nath Saha·Rachel Kahler·Akhila Mattapalli·Sriram Krishnamoorthy
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Abstract

We report on the utilization of a low-damage e-beam NiO$_x$ deposition process to realize field-plated heterojunction diodes (FP-HJDs) on (010) $\beta$-Ga$_2$O$_3$ films with high critical breakdown field strengths beyond 4 MV/cm and power figure of merits (PFOM) of >1 GW/cm$^2$. Diodes were fabricated on a 2.67 $\times$ 10$^{16}$ cm$^{-3}$ intentionally doped 6.2 $\mu$m thick epitaxial layer grown by metalorganic chemical vapor deposition (MOCVD) on a conductive Sn-doped $\beta$-Ga$_2$O$_3$ (010) substrate using TMGa, O$_2$, Ar carrier gas, and SiH$_4$ as the silicon dopant source. The mesa etched FP-HJD devices utilized a thin 7 nm e-beam NiO$_x$ interlayer before the sputtered NiO$_x$ layers to eliminate the effects of sputter-induced ion damage on the (010) epilayers. Current-Voltage measurements resulted in a forward current density of 700 A/cm$^2$ at 4 V, HJD ideality factor of 1.29, a V$_{bi}$ of 2 V, rectification ratio of 10$^{11}$, and a differential specific on resistance (R$_{on,sp}$) value of 2.36 m$\Omega$ $\times$ cm$^2$. Breakdown of the (010) FP-HJDs was 1.64 kV, leading to a parallel plane electric field at breakdown (E$_{||,max}$) of 4.02 MV/cm and a PFOM of 1.14 GW/cm$^2$, which is a state-of-the-art result for diodes on MOCVD-grown (010) drift layers.

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Carl Peterson, Yizheng Liu, Chinmoy Nath Saha, Rachel Kahler, Akhila Mattapalli, Sriram Krishnamoorthy. 2026-09-04. 4 MV/cm (010) $\beta$-Ga$_2$O$_3$ Heterojunction Diodes Realized by Low-Damage e-Beam NiO$_x$ Interlayers. https://arxiv.org/abs/2609.04655

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