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Single-Shot Readout with the Radio Frequency Single Electron Transistor in the Presence of Charge Noise

T. M. Buehler·D. J. Reilly·R. P. Starrett·Andrew D. Greentree·A. R. Hamilton·A. S. Dzurak·R. G. Clark
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Abstract

The radio frequency single electron transistor (rf-SET) possesses key requirements necessary for reading out a solid state quantum computer. This work explores the use of the rf-SET as a single-shot readout device in the presence of 1/f and telegraph charge noise. For a typical spectrum of 1/f noise we find that high fidelity, single-shot measurements are possible for signals q > 0.01e. For the case of telegraph noise, we present a cross-correlation measurement technique that uses two rf-SETs to suppress the effect of random switching events on readout. We demonstrate this technique by monitoring the charge state of a metal double dot system on microsecond time-scales. Such a scheme will be advantageous in achieving high readout fidelity in a solid state quantum computer.

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T. M. Buehler, D. J. Reilly, R. P. Starrett, Andrew D. Greentree, A. R. Hamilton, A. S. Dzurak, R. G. Clark. 2004-09-22. Single-Shot Readout with the Radio Frequency Single Electron Transistor in the Presence of Charge Noise. https://arxiv.org/abs/cond-mat/0304384

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