arXiv subjects

T. M. Buehler

Publications and source records attributed to T. M. Buehler.

12 recordsLinked to original sources

arXiv2006

Ion implanted Si:P double-dot with gate tuneable interdot coupling

We report on millikelvin charge sensing measurements of a silicon double-dot system fabricated by phosphorus ion implantation. An aluminum single-electron transistor (SET) is capacitively coupled to each of the implanted dots enabling the charging behavior of the double-dot system to be studied independently of current transport. Using an electrostatic gate, the interdot coupling can be tuned from weak to strong coupling. In the weak interdot coupling regime, the system exhibits well-defined double-dot charging behavior. By contrast, in the strong interdot coupling regime, the system behaves as a single-dot.

cond-mat.mes-hall↗

arXiv2006

Controlled single electron transfer between Si:P dots

We demonstrate electrical control of Si:P double dots in which the potential is defined by nanoscale phosphorus doped regions. Each dot contains approximately 600 phosphorus atoms and has a diameter close to 30 nm. On application of a differential bias across the dots, electron transfer is observed, using single electron transistors in both dc- and rf-mode as charge detectors. With the possibility to scale the dots down to few and even single atoms these results open the way to a new class of precision-doped quantum dots in silicon.

cond-mat.mes-hall↗

arXiv2005

Charge sensing in carbon nanotube quantum dots on microsecond timescales

We report fast, simultaneous charge sensing and transport measurements of gate-defined carbon nanotube quantum dots. Aluminum radio frequency single electron transistors (rf-SETs) capacitively coupled to the nanotube dot provide single-electron charge sensing on microsecond timescales. Simultaneously, rf reflectometry allows fast measurement of transport through the nanotube dot. Charge stability diagrams for the nanotube dot in the Coulomb blockade regime show extended Coulomb diamonds into the high-bias regime, as well as even-odd filling effects, revealed in charge sensing data.

cond-mat.mes-hall↗

arXiv2005

An ion-implanted silicon single-electron transistor

We report on the fabrication and electrical characterization at millikelvin temperatures of a novel silicon single-electron transistor (Si-SET). The island and source-drain leads of the Si-SET are formed by the implantation of phosphorus ions to a density above the metal-insulator-transition, with the tunnel junctions created by undoped regions. Surface gates above each of the tunnel junctions independently control the tunnel coupling between the Si-SET island and leads. The device shows periodic Coulomb blockade with a charging energy e$^2$/2C$_Σ$ $\sim$ 250 $μ$eV, and demonstrates a reproducible and controllable pathway to a silicon-based SET using CMOS processing techniques.

cond-mat.mes-hall↗

arXiv2004

Direct measurement of the maximum tunnel rate in a radio frequency single electron transistor operated as a microwave mixer

By operating the radio frequency single electron transistor (rf-SET) as a mixer we present measurements in which the RC roll-off of the tunnel junctions is observed at high frequencies. Our technique makes use of the non-linear rf-SET transconductance to mix high frequency gate signals and produce difference-frequency components that fall within the bandwidth of the rf-SET. At gate frequencies >15GHz the induced charge on the rf-SET island is altered on time-scales faster than the inverse tunnel rate, preventing mixer operation. We suggest the possibility of utilizing this technique to sense high frequency signals beyond the usual rf-SET bandwidth.

cond-mat.mes-hall↗

arXiv2004

Single-Shot Readout with the Radio Frequency Single Electron Transistor in the Presence of Charge Noise

The radio frequency single electron transistor (rf-SET) possesses key requirements necessary for reading out a solid state quantum computer. This work explores the use of the rf-SET as a single-shot readout device in the presence of 1/f and telegraph charge noise. For a typical spectrum of 1/f noise we find that high fidelity, single-shot measurements are possible for signals q > 0.01e. For the case of telegraph noise, we present a cross-correlation measurement technique that uses two rf-SETs to suppress the effect of random switching events on readout. We demonstrate this technique by monitoring the charge state of a metal double dot system on microsecond time-scales. Such a scheme will be advantageous in achieving high readout fidelity in a solid state quantum computer.

cond-mat.mes-hall↗

arXiv2004

Observing sub-microsecond telegraph noise with the radio frequency single electron transistor

Telegraph noise, which originates from the switching of charge between meta-stable trapping sites, becomes increasingly important as device sizes approach the nano-scale. For charge-based quantum computing, this noise may lead to decoherence and loss of read out fidelity. Here we use a radio frequency single electron transistor (rf-SET) to probe the telegraph noise present in a typical semiconductor-based quantum computer architecture. We frequently observe micro-second telegraph noise, which is a strong function of the local electrostatic potential defined by surface gate biases. We present a method for studying telegraph noise using the rf-SET and show results for a charge trap in which the capture and emission of a single electron is controlled by the bias applied to a surface gate.

cond-mat.mes-hall↗

arXiv2004

Radio-frequency operation of a double-island single-electron transistor

We present results on a double-island single-electron transistor (DISET) operated at radio-frequency (rf) for fast and highly sensitive detection of charge motion in the solid state. Using an intuitive definition for the charge sensitivity, we compare a DISET to a conventional single-electron transistor (SET). We find that a DISET can be more sensitive than a SET for identical, minimum device resistances in the Coulomb blockade regime. This is of particular importance for rf operation where ideal impedance matching to 50 Ohm transmission lines is only possible for a limited range of device resistances. We report a charge sensitivity of 5.6E-6 e/sqrt(Hz) for a rf-DISET, together with a demonstration of single-shot detection of small (<=0.1e) charge signals on microsecond timescales.

cond-mat.other↗

arXiv2004

Development and operation of the twin radio frequency single electron transistor for solid state qubit readout

Ultra-sensitive detectors and readout devices based on the radio frequency single electron transistor (rf-SET) combine near quantum-limited sensitivity with fast operation. Here we describe a twin rf-SET detector that uses two superconducting rf-SETs to perform fast, real-time cross-correlated measurements in order to distinguish sub-electron signals from charge noise on microsecond time-scales. The twin rf-SET makes use of two tuned resonance circuits to simultaneously and independently address both rf-SETs using wavelength division multiplexing (WDM) and a single cryogenic amplifier. We focus on the operation of the twin rf-SET as a charge detector and evaluate the cross-talk between the two resonance circuits. Real time suppression of charge noise is demonstrated by cross correlating the signals from the two rf-SETs. For the case of simultaneous operation, the rf-SETs had charge sensitivities of $δq_{SET1} = 7.5 μe/\sqrt{Hz}$ and $δq_{SET2} = 4.4 μe/\sqrt{Hz}$.

cond-mat.mes-hall↗

arXiv2002

Self-aligned fabrication process for silicon quantum computer devices

We describe a fabrication process for devices with few quantum bits (qubits), which are suitable for proof-of-principle demonstrations of silicon-based quantum computation. The devices follow the Kane proposal to use the nuclear spins of 31P donors in 28Si as qubits, controlled by metal surface gates and measured using single electron transistors (SETs). The accurate registration of 31P donors to control gates and read-out SETs is achieved through the use of a self-aligned process which incorporates electron beam patterning, ion implantation and triple-angle shadow-mask metal evaporation.

cond-mat↗

arXiv2002

Correlated charge detection for read-out of a solid state quantum computer

The single electron transistor (SET) is a prime candidate for reading out the final state of a qubit in a solid state quantum computer. Such a measurement requires the detection of sub-electron charge motion in the presence of random charging events. We present a detection scheme where the signals from two SETs are cross-correlated to suppress unwanted artifacts due to charge noise. This technique is demonstrated by using the two SETs to detect the charge state of two tunnel junction - coupled metal dots, thereby simulating charge transfer and readout in a two qubit system. These measurements indicate that for comparable buried dopant semiconductor architectures the minimum measurement time required to distinguish between the two charge states is of the order of 10 ns.

cond-mat.mes-hall↗

arXiv2002

Density dependent spin polarisation in ultra low-disorder quantum wires

There is controversy as to whether a one-dimensional (1D) electron gas can spin polarise in the absence of a magnetic field. Together with a simple model, we present conductance measurements on ultra low-disorder quantum wires supportive of a spin polarisation at B=0. A spin energy gap is indicated by the presence of a feature in the range 0.5 - 0.7 X 2e^2/h in conductance data. Importantly, it appears that the spin gap is not static but a function of the electron density. Data obtained using a bias spectroscopy technique are consistent with the spin gap widening further as the Fermi-level is increased.

cond-mat.str-el↗