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A model of transport nonuniversality in thick-film resistors

C. Grimaldi·T. Maeder·P. Ryser·S. Straessler
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Abstract

We propose a model of transport in thick-film resistors which naturally explains the observed nonuniversal values of the conductance exponent t extracted in the vicinity of the percolation transition. Essential ingredients of the model are the segregated microstructure typical of thick-film resistors and tunneling between the conducting grains. Nonuniversality sets in as consequence of wide distribution of interparticle tunneling distances.

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C. Grimaldi, T. Maeder, P. Ryser, S. Straessler. 2003-07-07. A model of transport nonuniversality in thick-film resistors. https://doi.org/10.1063/1.1590733

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