Measurement of the Localization Length through the superconductor-insulator transition of ultrathin amorphous beryllium films

Wenhao Wu; E. Bielejec

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Measurement of the Localization Length through the superconductor-insulator transition of ultrathin amorphous beryllium films

Wenhao Wu·E. Bielejec

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Abstract

Based on the Efros-Shklovskii behavior observed in electron transport and tunneling, we have determined, independently and up to a constant on the order of unity, the localization length and the dielectric constant for quench-condensed ultrathin amorphous beryllium films. As the normal-state sheet resistance of the films at 20 K is reduced with increasing film thickness, the localization length increases exponentially. The superconductor-insulator transition occurs when the localization length crosses the Ginzburg-Landau coherence length. We discuss the implication of these results on a number of issues regarding superconductivity in the strongly disordered regime.

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Wenhao Wu, E. Bielejec. 2005-11-02. Measurement of the Localization Length through the superconductor-insulator transition of ultrathin amorphous beryllium films. https://arxiv.org/abs/cond-mat/0310190

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