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X-Ray Scattering at Lanthanide M5 Resonances: Application to Magnetic Depth Profiling

H. Ott·C. Schuessler-Langeheine·E. Schierle·A. Yu. Grigoriev·V. Leiner·H. Zabel·G. Kaindl·E. Weschke
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Abstract

Quantitative analyses of x-ray scattering from thin films of Ho and Dy metal at the M_5 resonances result in values of the optical constants and the magnetic scattering lengths f_m, with f_m as large as 200 r_0. The observation of first- and second-order magnetic satellites allows to separate f_m into circular and linear dichroic contributions. This high magnetic sensitivity, in conjunction with the tunable x-ray probing depth across the resonance can be applied to monitor depth profiles of complex magnetic structures, as e.g. of helical antiferromagnetic domains in a Dy metal film.

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H. Ott, C. Schuessler-Langeheine, E. Schierle, A. Yu. Grigoriev, V. Leiner, H. Zabel, G. Kaindl, E. Weschke. 2005-09-28. X-Ray Scattering at Lanthanide M5 Resonances: Application to Magnetic Depth Profiling. https://arxiv.org/abs/cond-mat/0509725

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