arXiv · physics/0408081
On the characterisation of a Bragg spectrometer with X-rays from an ECR source
Abstract
Narrow X-ray lines from helium-like argon emitted from a dedicated ECR source have been used to determine the response function of a Bragg crystal spectrometer equipped with large area spherically bent silicon (111) or quartz (10$\bar{1}$) crystals. The measured spectra are compared with simulated ones created by a ray-tracing code based on the expected theoretical crystal's rocking curve and the geometry of the experimental set-up.
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D. F. Anagnostopoulos, S. Biri, D. Gotta, A. Gruber, Paul Indelicato, B. Leoni, H. Fuhrmann, L. M. Simons, L. Stingelin, A. Wasser, J. Zmeskal. 2004-12-23. On the characterisation of a Bragg spectrometer with X-rays from an ECR source. https://doi.org/10.1016/j.nima.2005.01.311
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