arXiv subjects

A. B. Zorin

Publications and source records attributed to A. B. Zorin.

48 records · Page 3Linked to original sources

arXiv2001

The effect of thermal annealing on the properties of Al-AlOx-Al single electron tunneling transistors

The effect of thermal annealing on the properties of Al-AlOx-Al single electron tunneling transistors is reported. After treatment of the devices by annealing processes in forming gas atmosphere at different temperatures and for different times, distinct and reproducible changes of their resistance and capacitance values were found. According to the temperature regime, we observed different behaviors as regards the resistance changes, namely the tendency to decrease the resistance by annealing at T = 200 degree C, but to increase the resistance by annealing at T = 400 degree C. We attribute this behavior to changes in the aluminum oxide barriers of the tunnel junctions. The good reproducibility of these effects with respect to the changes observed allows the proper annealing treatment to be used for post-process tuning of tunnel junction parameters. Also, the influence of the annealing treatment on the noise properties of the transistors at low frequency was investigated. In no case did the noise figures in the 1/f-regime show significant changes.

cond-mat.mes-hall↗

arXiv2001

Radio-frequency-driven motion of single Cooper pairs across the superconducting single-electron transistor with dissipative environment

We report on the effect of the frequency-locked transfer of single Cooper pairs in a superconducting single-electron Al transistor embedded in a dissipative environment (on-chip Cr resistor of R = 40 kOhm). The transistor was dc voltage biased, and the harmonic signal of frequency f of several MHz was applied to the gate. Due to the substantial rate of relaxation, the unidirectional transfer of single pairs occurred in each junction once per clock cycle and the current plateaus at I = 2ef were developed in the transistor's I-V curves. The mechanisms (supercurrent, Landau-Zener tunneling, quasiparticle tunneling, etc.) deteriorating the phase-locking regime are discussed.

cond-mat.mes-hall↗

arXiv2000

Radio-frequency Bloch-transistor electrometer

A quantum-limited electrometer based on charge modulation of the Josephson supercurrent in the Bloch transistor inserted into a superconducting ring is proposed. As this ring is inductive coupled to a high-Q resonance tank circuit, the variations of the charge on the transistor island (input signal) are converted into variations of amplitude and phase of radio-frequency oscillations in the tank. These variations are amplified and then detected. The output noise, the back-action fluctuations and their cross-correlation are computed. It is shown that our device enables measurements of the charge with a sensitivity which is determined by the energy resolution of its amplifier, that can be reduced down to the standard quantum limit of \hbar/2. On the basis of this setup a "back-action-evading" scheme of the charge measurements is proposed.

cond-mat.supr-con↗

arXiv2000

Cooper pair tunneling in circuits with substantial dissipation: the three-junction R-pump for single Cooper pairs

We propose a circuit comprising a linear array of three small-capacitance superconducting tunnel junctions with miniature resistors (R > R_Q = h/4e^2 = 6.5 kOhm) attached to the ends of this array. Owing to the Coulomb blockade effect and the effect of dissipative environment on the supercurrent, this circuit enables the gate-controlled transfer of individual Cooper pairs. The first experiment on operating the Al-Cr Cooper pair R-pump is described.

cond-mat.supr-con↗

arXiv2000

Metallic single-electron transistor without traditional tunnel barriers

We report on a new type of single-electron transistor (SET) comprising two highly resistive Cr thin-film strips (~ 1um long) connecting a 1 um-long Al island to two Al outer electrodes. These resistors replace small-area oxide tunnel junctions of traditional SETs. Our transistor with a total asymptotic resistance of 110 kOhm showed a very sharp Coulomb blockade and reproducible, deep and strictly e-periodic gate modulation in wide ranges of bias currents I and gate voltages V_g. In the Coulomb blockade region (|V| < 0.5 mV), we observed a strong suppression of the cotunneling current allowing appreciable modulation curves V-V_g to be measured at currents I as low as 100 fA. The noise figure of our SET was found to be similar to that of typical Al/AlOx/Al single-electron transistors.

cond-mat.mes-hall↗

arXiv2000

The single electron R-pump: first experiment

We fabricated and tested the single electron R-pump, i.e. a three-junction Al circuit with on-chip Cr resistors. We show that due to the presence of the resistors (R > h/e^2 = 25.8 kOhm), the accuracy of electron transfer in the R-pump can approach the level of 10^-8. Preliminary results of experiment with the R-pump made at PTB are reported.

cond-mat.mes-hall↗

arXiv1999

Aluminum Single Electron Transistors with Islands Isolated from a Substrate

The low-frequency noise figures of single-electron transistors (electrometers) of traditional planar and new stacked geometry were compared. We observed a correlation between the charge noise and the contact area of the transistor island with a dielectric substrate in the set of Al transistors located on the same chip and having almost similar electric parameters. We have found that the smaller the contact area the lower the noise level of the transistor. The lowest noise value 8*10E-6 e/sqrt(Hz) at f = 10 Hz. has been measured in a stacked transistor with an island which was completely isolated from a substrate. Our measurements have unambiguously indicated that the dominant source of the background charge fluctuations is associated with a dielectric substrate

cond-mat.mes-hall↗

arXiv1999

Coulomb blockade and cotunneling in single electron circuits with on-chip resistors: towards the implementation of R-pump

We report on the investigation of Al single electron structures equipped with miniature (8 um long) on-chip Cr resistors of R > R_k = h/e^2 = 25.8 kOhm. From the measurement of the Coulomb blockade in single-junction structures we evaluated the self-capacitance of our resistors per unit length, c = 62 aF/um. We demonstrate that the cotunneling current in the transistor samples in the Coulomb blockade regime obeys the power law, $I \propto V^{3+(R/R_k)}$, predicted by Odintsov, Bubanja and Schön for a transistor having pure ohmic-resistance leads. The concept of the three-junction single electron pump with on-chip resistors (R-pump) is developed. We demonstrate that the implementation of the R-pump with a relative accuracy of the electron transfer of 10^{-8} is quite feasible with the technology available.

cond-mat.mes-hall↗

arXiv1999

Characterization of All-Chromium Tunnel Junctions and Single Electron Tunneling Devices Fabricated by Direct-Writing Multilayer Technique

We report about the fabrication and analysis of the properties of Cr/CrO_x/Cr tunnel junctions and SET transistors, prepared by different variants of direct-writing multilayer technique. In all cases, the CrO_x tunnel barriers were formed in air under ambient conditions. From the experiments on single junctions, values for the effective barrier height and thickness were derived. For the Cr/CrO_x/Cr SET transistors we achieved minimal junction areas of 17 x 60 nm^2 using a scanning transmission electron microscope for the e-beam exposure on Si_3N_4 membrane substrate. We discuss the electrical performance of the transistor samples as well as their noise behavior.

cond-mat.mes-hall↗

arXiv1999

Storage capabilities of a 4-junction single electron trap with an on-chip resistor

We report on the operation of a single electron trap comprising a chain of four Al/AlOx/Al tunnel junctions attached, at one side, to a memory island and, at the other side, to a miniature on-chip Cr resistor R=50 kOhm which served to suppress cotunneling. At appropriate voltage bias the bi-stable states of the trap, with the charges differing by the elementary charge e, were realized. At low temperature, spontaneous switching between these states was found to be infrequent. For instance, at T=70 mK the system was capable of holding an electron for more than 2 hours, this time being limited by the time of the measurement.

cond-mat.mes-hall↗

arXiv1999

Superconducting Electrometer Based on the Resistively Shunted Bloch Transistor

We have fabricated the Bloch transistor shunted on-chip by a small-sized Cr resistor with Rs about 1 kOhm. The Bloch transistor normally consists of two small Josephson junctions connected in series, which in our case have been replaced by two superconducting interferometer loops, each with two junctions in parallel. A capacitively coupled gate is supplied to control the induced charge of the small intermediate electrode (island) of the transistor. The measured I-V curves show no hysteresis and correspond to the operation of a effective Josephson junction at the high-damping and strong-noise limits. The critical current of the system was found to be close to its nominal value, that is in accordance with the electromagnetic environment theory. The I-V curves were modulated by the gate with a period of e and a maximum swing of about 2 /mu_V. Such rather moderate modulation results from the Josephson-to- charging energies ratio, Ej/Ec about 9, in our sample being far from its optimum value of 0.3 up to 1.

cond-mat.mes-hall↗

arXiv1998

Noise in Al single electron transistors of stacked design

We have fabricated and examined several Al single electron transistors whose small islands were positioned on top of a counter electrode and hence did not come into contact with a dielectric substrate. The equivalent charge noise figure of all transistors turned out to be surprisingly low, (2.5 - 7)*10E-5 e/sqrt(Hz) at f = 10 Hz. Although the lowest detected noise originates mostly from fluctuations of background charge, the noise contribution of the tunnel junction conductances was, on occasion, found to be dominant.

cond-mat.mes-hall↗