arXiv subjects

J. Niemeyer

Publications and source records attributed to J. Niemeyer.

23 records · Page 2Linked to original sources

arXiv1999

Coulomb blockade and cotunneling in single electron circuits with on-chip resistors: towards the implementation of R-pump

We report on the investigation of Al single electron structures equipped with miniature (8 um long) on-chip Cr resistors of R > R_k = h/e^2 = 25.8 kOhm. From the measurement of the Coulomb blockade in single-junction structures we evaluated the self-capacitance of our resistors per unit length, c = 62 aF/um. We demonstrate that the cotunneling current in the transistor samples in the Coulomb blockade regime obeys the power law, $I \propto V^{3+(R/R_k)}$, predicted by Odintsov, Bubanja and Schön for a transistor having pure ohmic-resistance leads. The concept of the three-junction single electron pump with on-chip resistors (R-pump) is developed. We demonstrate that the implementation of the R-pump with a relative accuracy of the electron transfer of 10^{-8} is quite feasible with the technology available.

cond-mat.mes-hall↗

arXiv1999

Characterization of All-Chromium Tunnel Junctions and Single Electron Tunneling Devices Fabricated by Direct-Writing Multilayer Technique

We report about the fabrication and analysis of the properties of Cr/CrO_x/Cr tunnel junctions and SET transistors, prepared by different variants of direct-writing multilayer technique. In all cases, the CrO_x tunnel barriers were formed in air under ambient conditions. From the experiments on single junctions, values for the effective barrier height and thickness were derived. For the Cr/CrO_x/Cr SET transistors we achieved minimal junction areas of 17 x 60 nm^2 using a scanning transmission electron microscope for the e-beam exposure on Si_3N_4 membrane substrate. We discuss the electrical performance of the transistor samples as well as their noise behavior.

cond-mat.mes-hall↗

arXiv1999

Storage capabilities of a 4-junction single electron trap with an on-chip resistor

We report on the operation of a single electron trap comprising a chain of four Al/AlOx/Al tunnel junctions attached, at one side, to a memory island and, at the other side, to a miniature on-chip Cr resistor R=50 kOhm which served to suppress cotunneling. At appropriate voltage bias the bi-stable states of the trap, with the charges differing by the elementary charge e, were realized. At low temperature, spontaneous switching between these states was found to be infrequent. For instance, at T=70 mK the system was capable of holding an electron for more than 2 hours, this time being limited by the time of the measurement.

cond-mat.mes-hall↗

arXiv1999

Superconducting Electrometer Based on the Resistively Shunted Bloch Transistor

We have fabricated the Bloch transistor shunted on-chip by a small-sized Cr resistor with Rs about 1 kOhm. The Bloch transistor normally consists of two small Josephson junctions connected in series, which in our case have been replaced by two superconducting interferometer loops, each with two junctions in parallel. A capacitively coupled gate is supplied to control the induced charge of the small intermediate electrode (island) of the transistor. The measured I-V curves show no hysteresis and correspond to the operation of a effective Josephson junction at the high-damping and strong-noise limits. The critical current of the system was found to be close to its nominal value, that is in accordance with the electromagnetic environment theory. The I-V curves were modulated by the gate with a period of e and a maximum swing of about 2 /mu_V. Such rather moderate modulation results from the Josephson-to- charging energies ratio, Ej/Ec about 9, in our sample being far from its optimum value of 0.3 up to 1.

cond-mat.mes-hall↗

arXiv1998

Noise in Al single electron transistors of stacked design

We have fabricated and examined several Al single electron transistors whose small islands were positioned on top of a counter electrode and hence did not come into contact with a dielectric substrate. The equivalent charge noise figure of all transistors turned out to be surprisingly low, (2.5 - 7)*10E-5 e/sqrt(Hz) at f = 10 Hz. Although the lowest detected noise originates mostly from fluctuations of background charge, the noise contribution of the tunnel junction conductances was, on occasion, found to be dominant.

cond-mat.mes-hall↗