arXiv subjects

Ulf Schlichtmann

Publications and source records attributed to Ulf Schlichtmann.

62 records · Page 4Linked to original sources

arXiv2017

Timing Model Extraction for Sequential Circuits Considering Process Variations

As semiconductor devices continue to scale down, process vari- ations become more relevant for circuit design. Facing such variations, statistical static timing analysis is introduced to model variations more accurately so that the pessimism in tra- ditional worst case timing analysis is reduced. Because all de- lays are modeled using correlated random variables, most statis- tical timing methods are much slower than corner based timing analysis. To speed up statistical timing analysis, we propose a method to extract timing models for flip-flop and latch based sequential circuits respectively. When such a circuit is used as a module in a hierarchical design, the timing model instead of the original circuit is used for timing analysis. The extracted timing models are much smaller than the original circuits. Ex- periments show that using extracted timing models accelerates timing verification by orders of magnitude compared to previ- ous approaches using flat netlists directly. Accuracy is main- tained, however, with the mean and standard deviation of the clock period both showing usually less than 1% error compared to Monte Carlo simulation on a number of benchmark circuits.

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arXiv2017

Post-Route Refinement for High-Frequency PCBs Considering Meander Segment Alleviation

In this paper, we propose a post-processing framework which iteratively refines the routing results from an existing PCB router by removing dense meander segments. By swapping and detouring dense meander segments the proposed method can effectively alleviate accumulating crosstalk noise, while respecting pre-defined area constraints. Experimental results show more than 85% reduction of the meander segments and hence the noise cost.

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arXiv2017

EffiTest: Efficient Delay Test and Statistical Prediction for Configuring Post-silicon Tunable Buffers

At nanometer manufacturing technology nodes, process variations significantly affect circuit performance. To combat them, post- silicon clock tuning buffers can be deployed to balance timing bud- gets of critical paths for each individual chip after manufacturing. The challenge of this method is that path delays should be mea- sured for each chip to configure the tuning buffers properly. Current methods for this delay measurement rely on path-wise frequency stepping. This strategy, however, requires too much time from ex- pensive testers. In this paper, we propose an efficient delay test framework (EffiTest) to solve the post-silicon testing problem by aligning path delays using the already-existing tuning buffers in the circuit. In addition, we only test representative paths and the delays of other paths are estimated by statistical delay prediction. Exper- imental results demonstrate that the proposed method can reduce the number of frequency stepping iterations by more than 94% with only a slight yield loss.

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arXiv2017

Novel CMOS RFIC Layout Generation with Concurrent Device Placement and Fixed-Length Microstrip Routing

With advancing process technologies and booming IoT markets, millimeter-wave CMOS RFICs have been widely developed in re- cent years. Since the performance of CMOS RFICs is very sensi- tive to the precision of the layout, precise placement of devices and precisely matched microstrip lengths to given values have been a labor-intensive and time-consuming task, and thus become a major bottleneck for time to market. This paper introduces a progressive integer-linear-programming-based method to gener- ate high-quality RFIC layouts satisfying very stringent routing requirements of microstrip lines, including spacing/non-crossing rules, precise length, and bend number minimization, within a given layout area. The resulting RFIC layouts excel in both per- formance and area with much fewer bends compared with the simulation-tuning based manual layout, while the layout gener- ation time is significantly reduced from weeks to half an hour.

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arXiv2017

PieceTimer: A Holistic Timing Analysis Framework Considering Setup/Hold Time Interdependency Using A Piecewise Model

In static timing analysis, clock-to-q delays of flip-flops are considered as constants. Setup times and hold times are characterized separately and also used as constants. The characterized delays, setup times and hold times, are ap- plied in timing analysis independently to verify the perfor- mance of circuits. In reality, however, clock-to-q delays of flip-flops depend on both setup and hold times. Instead of being constants, these delays change with respect to different setup/hold time combinations. Consequently, the simple ab- straction of setup/hold times and constant clock-to-q delays introduces inaccuracy in timing analysis. In this paper, we propose a holistic method to consider the relation between clock-to-q delays and setup/hold time combinations with a piecewise linear model. The result is more accurate than that of traditional timing analysis, and the incorporation of the interdependency between clock-to-q delays, setup times and hold times may also improve circuit performance.

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arXiv2017

Sampling-based Buffer Insertion for Post-Silicon Yield Improvement under Process Variability

At submicron manufacturing technology nodes process variations affect circuit performance significantly. This trend leads to a large timing margin and thus overdesign to maintain yield. To combat this pessimism, post-silicon clock tuning buffers can be inserted into circuits to balance timing budgets of critical paths with their neighbors. After manufacturing, these clock buffers can be configured for each chip individually so that chips with timing failures may be rescued to improve yield. In this paper, we propose a sampling-based method to determine the proper locations of these buffers. The goal of this buffer insertion is to reduce the number of buffers and their ranges, while still maintaining a good yield improvement. Experimental results demonstrate that our algorithm can achieve a significant yield improvement (up to 35%) with only a small number of buffers.

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arXiv2017

Static Timing Model Extraction for Combinational Circuits

For large circuits, static timing analysis (STA) needs to be performed in a hierarchical manner to achieve higher performance in arrival time propagation. In hierarchical STA, efficient and accurate timing models of sub-modules need to be created. We propose a timing model extraction method that significantly reduces the size of timing models without losing any accuracy by removing redundant timing information. Circuit components which do not contribute to the delay of any input to output pair are removed. The proposed method is deterministic. Compared to the original models, the numbers of edges and vertices of the resulting timing models are reduced by 84% and 85% on average, respectively, which are significantly more than the results achieved by other methods.

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arXiv2014

Emulated ASIC Power and Temperature Monitor System for FPGA Prototyping of an Invasive MPSoC Computing Architecture

In this contribution the emulation of an ASIC temperature and power monitoring system (TPMon) for FPGA prototyping is presented and tested to control processor temperatures under different control targets and operating strategies. The approach for emulating the power monitor is based on an instruction-level energy model. For emulating the temperature monitor, a thermal RC model is used. The monitoring system supplies an invasive MPSoC computing architecture with hardware status information (power and temperature data of the processors within the system). These data are required for resource-aware load distribution. As a proof of concept different operating strategies and control targets were evaluated for a 2-tile invasive MPSoC computing system.

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