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arXiv · 0709.1004

Measurement of focusing properties for high numerical aperture optics using an automated submicron beamprofiler

J. J. Chapman·B. G. Norton·E. W. Streed·D. Kielpinski
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Abstract

The focusing properties of three aspheric lenses with numerical aperture (NA) between 0.53 and 0.68 were directly measured using an interferometrically referenced scanning knife-edge beam profiler with sub-micron resolution. The results obtained for two of the three lenses tested were in agreement with paraxial gaussian beam theory. It was also found that the highest NA aspheric lens which was designed for 830nm was not diffraction limited at 633nm. This process was automated using motorized translation stages and provides a direct method for testing the design specifications of high numerical aperture optics.

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J. J. Chapman, B. G. Norton, E. W. Streed, D. Kielpinski. 2007-09-07. Measurement of focusing properties for high numerical aperture optics using an automated submicron beamprofiler. https://doi.org/10.1063/1.2991112

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