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arXiv · 1212.5045

Challenges for Silicon Pixel Sensors at the European XFEL

Robert Klanner·Julian Becker·Eckhart Fretwurst·Ioana Pintilie·Thomas Poehlsen·Jörn Schwandt·Jiaguo Zhang
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Abstract

A systematic experimental study of the main challenges for silicon-pixel sensors at the European XFEL is presented. The high instantaneous density of X-rays and the high repetition rate of the XFEL pulses result in signal distortions due to the plasma effect and in severe radiation damage. The main parameters of X-ray-radiation damage have been determined and their impact on p+n sensors investigated. These studies form the basis of the optimized design of a pixel-sensor for experimentation at the European XFEL.

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Robert Klanner, Julian Becker, Eckhart Fretwurst, Ioana Pintilie, Thomas Poehlsen, Jörn Schwandt, Jiaguo Zhang. 2012-12-20. Challenges for Silicon Pixel Sensors at the European XFEL. https://doi.org/10.1016/j.nima.2013.05.166

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