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arXiv · 1405.2053

Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy

J. Schaab·I. P. Krug·F. Nickel·D. M. Gottlob·H. Doğanay·A. Cano·M. Hentschel·Z. Yan·E. Bourret·C. M. Schneider·R. Ramesh·D. Meier
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Abstract

High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high-spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contract-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics.

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J. Schaab, I. P. Krug, F. Nickel, D. M. Gottlob, H. Doğanay, A. Cano, M. Hentschel, Z. Yan, E. Bourret, C. M. Schneider, R. Ramesh, D. Meier. 2014-05-09. Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy. https://doi.org/10.1063/1.4879260

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