Room-temperature 1.54 $μ$m photoluminescence of Er:O$_x$ centers at extremely low concentration in silicon

Abstract

The demand for single photon sources at $λ~=~1.54~μ$m, which follows from the consistent development of quantum networks based on commercial optical fibers, makes Er:O$_x$ centers in Si still a viable resource thanks to the optical transition of $Er^{3+}~:~^4I_{13/2}~\rightarrow~^4I_{15/2}$. Yet, to date, the implementation of such system remains hindered by its extremely low emission rate. In this Letter, we explore the room-temperature photoluminescence (PL) at the telecomm wavelength of very low implantation doses of $Er:O_x$ in $Si$. The emitted photons, excited by a $λ~=~792~nm$ laser in both large areas and confined dots of diameter down to $5~μ$m, are collected by an inverted confocal microscope. The lower-bound number of detectable emission centers within our diffraction-limited illumination spot is estimated to be down to about 10$^4$, corresponding to an emission rate per individual ion of about $4~\times~10^{3}$ photons/s.