Lithography-free electrical transport measurements on 2D materials by direct microprobing

Patricia Gant; Yue Niu; Simon A. Svatek; Nicolás Agraït; Carmen Munuera; Mar García- Hernández; Riccardo Frisenda; David Perez de Lara; Andres Castellanos-Gomez

doi:10.1039/c7tc01203a

arXiv · 1705.07889

Lithography-free electrical transport measurements on 2D materials by direct microprobing

Patricia Gant·Yue Niu·Simon A. Svatek·Nicolás Agraït·Carmen Munuera·Mar García- Hernández·Riccardo Frisenda·David Perez de Lara·Andres Castellanos-Gomez

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Abstract

We present a method to carry out electrical and opto-electronic measurements on 2D materials using carbon fiber microprobes to directly make electrical contacts to the 2D materials without damaging them. The working principle of this microprobing method is illustrated by measuring transport in MoS2 flakes in vertical (transport in the out-of-plane direction) and lateral (transport within the crystal plane) configurations, finding performances comparable to those reported for MoS2 devices fabricated by conventional lithographic process. We also show that this method can be used with other 2D materials.

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Patricia Gant, Yue Niu, Simon A. Svatek, Nicolás Agraït, Carmen Munuera, Mar García- Hernández, Riccardo Frisenda, David Perez de Lara, Andres Castellanos-Gomez. 2017-05-20. Lithography-free electrical transport measurements on 2D materials by direct microprobing. https://doi.org/10.1039/c7tc01203a

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