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arXiv · 2008.02732

Radiative capture rates at deep defects from electronic structure calculations

Cyrus E. Dreyer·Audrius Alkauskas·John L. Lyons·Chris G. Van de Walle
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Abstract

We present a methodology to calculate radiative carrier capture coefficients at deep defects in semiconductors and insulators from first principles. Electronic structure and lattice relaxations are accurately described with hybrid density functional theory. Calculations of capture coefficients provide an additional validation of the accuracy of these functionals in dealing with localized defect states. We also discuss the validity of the Condon approximation, showing that even in the event of large lattice relaxations the approximation is accurate. We test the method on GaAs:$V_\text{Ga}$-$\text{Te}_\text{As}$ and GaN:C$_\text{N}$, for which reliable experiments are available, and demonstrate very good agreement with measured capture coefficients.

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Cyrus E. Dreyer, Audrius Alkauskas, John L. Lyons, Chris G. Van de Walle. 2020-08-06. Radiative capture rates at deep defects from electronic structure calculations. https://arxiv.org/abs/2008.02732

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