arXiv · 2311.18087
Time-of-Flight X-ray Measurements for Computed Tomography
Abstract
Time-of-flight (ToF) measurements is a possible alternative to anti-scatter grids in computed tomography (CT). Simulations have shown a possible 75% reduction in the detrimental scattering contribution with a 100 ps FWHM timing resolution. A test bench comprising a pulsed X-ray source and a time-correlated detector has been designed to demonstrate the feasibility of time-of-flight measurements of X-rays using readout electronics inherited from a ToF-positron emission tomography project. A 86 ps FWHM coincidence time resolution have been achieved with 511 keV annihilation gamma-rays and a 155 ps FWHM timing jitter with a 120 kVp pulsed X-rays source.
Explore related subjects
Keep this discovery
Gaëtan Lemaire, Romain Espagnet, Julien Rossignol, Louis-Daniel Gaulin, Edouard Villemure, Audrey Corbeil Therrien, Yves Bérubé-Lauzière, Marc-André Tétrault, Réjean Fontaine. 2023-11-29. Time-of-Flight X-ray Measurements for Computed Tomography. https://arxiv.org/abs/2311.18087
Cite the original work for its findings. Save a collection to share your selection of sources.