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arXiv · 2401.11920

The quality assurance test of the SliT ASIC for the J-PARC muon $g-2$/EDM experiment

Takashi Yamanaka·Yoichi Fujita·Eitaro Hamada·Tetsuichi Kishishita·Tsutomu Mibe·Yutaro Sato·Yoshiaki Seino·Masayoshi Shoji·Taikain Suehara·Manobu M. Tanaka·Junji Tojo·Keisuke Umebayashi·Tamaki Yoshioka
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Abstract

The SliT ASIC is a readout chip for the silicon strip detector to be used at the J-PARC muon $g-2$/EDM experiment. The production version of SliT128D was designed and mass production was finished. A quality assurance test method for bare SliT128D chips was developed to provide a sufficient number of chips for the experiment. The quality assurance test of the SliT128D chips was performed and 5735 chips were inspected. No defect was observed in chips of 84.3%. Accepting a few channels with poor time walk performance out of 128 channels per chip, more than 90% yield can be achieved, which is sufficient to construct the whole detector.

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Takashi Yamanaka, Yoichi Fujita, Eitaro Hamada, Tetsuichi Kishishita, Tsutomu Mibe, Yutaro Sato, Yoshiaki Seino, Masayoshi Shoji, Taikain Suehara, Manobu M. Tanaka, Junji Tojo, Keisuke Umebayashi, Tamaki Yoshioka. 2024-01-22. The quality assurance test of the SliT ASIC for the J-PARC muon $g-2$/EDM experiment. https://arxiv.org/abs/2401.11920

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