Charge accumulation by Direct Magnetoelectric Effect in ScAlN/Ni Nanoscale Devices

Abstract

This work investigates the direct magnetoelectric effect in thin-film lab scale composite heterostructures comprising a 100 nm thick piezoelectric Sc0.4Al0.6N (ScAlN) and a magnetostrictive Ni with 100-200 nm thickness, fabricated on Si/SiO2 substrates. The films are patterned into square pillar arrays with lateral dimensions down to 500 nm x 500 nm. Vibrating sample magnetometry (VSM) measurements reveal in-plane magnetic anisotropy in the Ni films, attributed to strain induced by the underlying ScAlN layer. Nitrogen-vacancy (NV) magnetometry imaging confirms the formation of magnetic domains at remanence in polycrystalline Ni when patterned in sub-microscale structures. Capacitance measurements reveal a ScAlN dielectric constant at the device level consistent with unpatterned thin films, confirming the preservation of electrical integrity at the sub-microscale. The direct magnetoelectric effect is demonstrated through quasi-static charge measurements under applied out-of-plane DC magnetic fields, yielding equivalent open-circuit voltages up to 1.17 mV.