arXiv subjects

Steven M. Anlage

Publications and source records attributed to Steven M. Anlage.

149 records · Page 9Linked to original sources

arXiv1998

Measurement of Resonant Frequency and Quality Factor of Microwave Resonators: Comparison of Methods

Precise microwave measurements of sample conductivity, dielectric, and magnetic properties are routinely performed with cavity perturbation measurements. These methods require the accurate determination of quality factor and resonant frequency of microwave resonators. Seven different methods to determine the resonant frequency and quality factor from complex transmission coefficient data are discussed and compared to find which is most accurate and precise when tested using identical data. We find that the nonlinear least-squares fit to the phase vs. frequency is the most accurate and precise when the signal-to-noise ratio is greater than 65. For noisier data, the nonlinear least squares fit to a Lorentzian curve is more accurate and precise. The results are general and can be applied to the analysis of many kinds of resonant phenomena.

cond-mat.mtrl-sci↗

arXiv1998

Near-Field Scanning Microwave Microscopy: Measuring Local Microwave Properties and Electric Field Distributions

We describe the near-field microwave microscopy of microwave devices on a length scale much smaller than the wavelength used for imaging. Our microscope can be operated in two possible configurations, allowing a quantitative study of either material properties or local electric fields.

cond-mat.mtrl-sci↗

arXiv1998

Quantitative topographic imaging using a near-field scanning microwave microscope

We describe a technique for extracting topographic information using a scanning near-field microwave microscope. By monitoring the shift of the system's resonant frequency, we obtain quantitative topographic images of uniformly conducting metal surfaces. At a frequency of 9.572 GHz, our technique allows for a height discrimination of about 55 nm at a separation of 30 microns. We present topographic images of uneven, conducting samples and compare the height response and sensitivity of the system with theoretical expectations.

cond-mat.mtrl-sci↗

arXiv1997

Quantitative Imaging of Sheet Resistance with a Scanning Near-Field Microwave Microscope

We describe quantitative imaging of the sheet resistance of metallic thin films by monitoring frequency shift and quality factor in a resonant scanning near-field microwave microscope. This technique allows fast acquisition of images at approximately 10 ms per pixel over a frequency range from 0.1 to 50 GHz. In its current configuration, the system can resolve changes in sheet resistance as small as 0.6 Ohms/sq for 100 Ohms/sq films. We demonstrate its use at 7.5 GHz by generating a quantitative sheet resistance image of a YBa2Cu3O7 (YBCO) thin film on a 5 cm-diameter sapphire wafer.

cond-mat.mtrl-sci↗

arXiv1997

Surface Resistance Imaging with a Scanning Near-Field Microwave Microscope

We describe near-field imaging of sample sheet resistance via frequency shifts in a resonant coaxial scanning microwave microscope. The frequency shifts are related to local sample properties, such as surface resistance and dielectric constant. We use a feedback circuit to track a given resonant frequency, allowing measurements with a sensitivity to frequency shifts as small as one parts in 50000 for a 30 ms sampling time. The frequency shifts can be converted to sheet resistance based on a simple model of the system.

cond-mat.mtrl-sci↗