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arXiv · 2007.01557

Using $^{22}$Na and $^{83{\rm m}}$Kr to calibrate and study the properties of scintillation in xenon-doped liquid argon

Y. Y. Gan·M. Y. Guan·Y. P. Zhang·P. Zhang·C. G. Yang·Q. Zhao·Y. T. Wei·W. X. Xiong
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Abstract

We have measured the properties of scintillation light in liquid argon doped with xenon concentrations from 165 ppm to 10,010 ppm using a $^{22}$Na source. The energy transfer processes in the xenon-doped liquid argon are discussed in detail, and a new waveform model is established and used to fit the average waveform. The time profile of the scintillation photon in the xenon-doped liquid argon and of the TPB emission are presented. The quantities of xenon-doped are controlled by a Mass Flow Controller which is calibrated via a Redusial Gas Analyzer to ensure that the xenon concentration is accurate. In addition, a successful test of $^{83{\rm m}}$Kr as a calibration source has been implemented in the xenon-doped liquid argon detector for the first time. By comparing the light yield of the $^{22}$Na and $^{83{\rm m}}$Kr, it can be concluded that the scintillation efficiency is almost same over the range of 41.5 keV to 511 keV.

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Y. Y. Gan, M. Y. Guan, Y. P. Zhang, P. Zhang, C. G. Yang, Q. Zhao, Y. T. Wei, W. X. Xiong. 2020-07-03. Using $^{22}$Na and $^{83{\rm m}}$Kr to calibrate and study the properties of scintillation in xenon-doped liquid argon. https://doi.org/10.1088/1748-0221/15/12/p12007

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