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arXiv · 2409.03374

Toward a universal characterization methodology for conversion gain measurement of CMOS APS: application to Euclid and SVOM

Jean Le Graët·Aurélia Secroun·Marie Tourneur-Silvain·Éric Kajfasz·Jean-Luc Atteia·Olivier Boulade·Alix Nouvel de la Flèche·Hervé Geoffray·William Gillard·Stéphanie Escoffier·Francis Fortin·Nicolas Fourmanoit·Smaïn Kermiche·Hervé Valentin·Julien Zoubian
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Abstract

With the expanding integration of infrared instruments in astronomical missions, accurate per-pixel flux estimation for near-infrared hybrid detectors has become critical to the success of these missions. Based on CPPM's involvement in both SVOM/Colibri and Euclid missions, this study introduces universally applicable methods and framework for characterizing IR hybrid detectors and decorrelating their intrinsic properties. The characterization framework, applied to the ALFA detector and \Euclid's H2RG, not only validates the proposed methods but also points out subtle behaviors inherent to each detector.

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Jean Le Graët, Aurélia Secroun, Marie Tourneur-Silvain, Éric Kajfasz, Jean-Luc Atteia, Olivier Boulade, Alix Nouvel de la Flèche, Hervé Geoffray, William Gillard, Stéphanie Escoffier, Francis Fortin, Nicolas Fourmanoit, Smaïn Kermiche, Hervé Valentin, Julien Zoubian. 2024-09-05. Toward a universal characterization methodology for conversion gain measurement of CMOS APS: application to Euclid and SVOM. https://doi.org/10.1117/12.3020095

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