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Cryogenic sapphire oscillator with exceptionally high long-term frequency stability

J. G. Hartnett·C. R. Locke·E. N. Ivanov·M. E. Tobar·P. L. Stanwix
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Abstract

We report on the development of a sapphire cryogenic microwave resonator oscillator long-term fractional frequency stability of 2x10^-17Sqrt[τ] for integration times τ>10^3 s and negative drift of about 2.2x10^-15/day. The short-term frequency instability of the oscillator is highly reproducible and also state-of-the-art: 5.6x10^-16 for an integration time of τ~ 20 s.

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J. G. Hartnett, C. R. Locke, E. N. Ivanov, M. E. Tobar, P. L. Stanwix. 2006-10-04. Cryogenic sapphire oscillator with exceptionally high long-term frequency stability. https://doi.org/10.1063/1.2387969

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