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arXiv · 1809.04111

Investigation of Amorphous Germanium Contact Properties with Planar Detectors Made from Home-Grown Germanium Crystals

W. -Z. Wei·X. -H. Meng·Y. -Y. Yang·J. Liu·G. -J. Wang·H. Mei·G. Gang·D. -M. Mei·C. Zhang
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Abstract

The characterization of detectors fabricated from home-grown crystals is the most direct way to study crystal properties. We fabricated planar detectors from high-purity germanium (HPGe) crystals grown at the University of South Dakota (USD). In the fabrication process, a HPGe crystal slice cut from a USD-grown crystal was coated with a high resistivity thin film of amorphous Ge (a-Ge) followed by depositing a thin layer of aluminum on top of the a-Ge film to define the physical area of the contacts. We investigated the detector performance including the $I$-$V$ characteristics, $C$-$V$ characteristics and spectroscopy measurements for a few detectors. The results document the good quality of the USD-grown crystals and electrical contacts.

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W. -Z. Wei, X. -H. Meng, Y. -Y. Yang, J. Liu, G. -J. Wang, H. Mei, G. Gang, D. -M. Mei, C. Zhang. 2018-09-11. Investigation of Amorphous Germanium Contact Properties with Planar Detectors Made from Home-Grown Germanium Crystals. https://arxiv.org/abs/1809.04111

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