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arXiv · 2604.15905

Electroluminescence Yield Measurements in Xenon Gas with the NEXT-DEMO++ Detector

NEXT Collaboration·J. Renner·J. D. Villamil·N. López-March·K. Mistry·P. Novella·A. Simón·V. Álvarez·J. M. Benlloch-Rodríguez·M. Cid·C. Cortes-Parra·R. Esteve·F. Kellerer·J. Martín-Albo·A. Martínez·G. Martínez-Lema·M. Martínez-Vara·M. Querol·P. Saharia·M. Sorel·S. Teruel-Pardo·H. Almazán·L. Arazi·I. J. Arnquist·F. Auria-Luna·S. Ayet·Y. Ayyad·C. D. R. Azevedo·F. Ballester·J. E. Barcelon·M. del Barrio-Torregrosa·F. I. G. M. Borges·A. Brodoline·N. Byrnes·A. Castillo·E. Church·X. Cid·C. A. N. Conde·F. P. Cossío·R. Coupe·E. Dey·P. Dietz·C. Echeverria·M. Elorza·R. Felkai·L. M. P. Fernandes·P. Ferrario·P. Ferrero Mancheño·F. W. Foss·Z. Freixa·J. García-Barrena·J. J. Gómez-Cadenas·J. W. R. Grocott·R. Guenette·J. Hauptman·C. A. O. Henriques·J. A. Hernando Morata·P. Herrero-Gómez·V. Herrero·C. Hervés Carrete·Y. Ifergan·A. F. B. Isabel·B. J. P. Jones·L. Larizgoitia·A. Larumbe·P. Lebrun·F. Lopez·R. Madigan·R. D. P. Mano·A. Marauri·A. P. Marques·R. L. Miller·J. Molina-Canteras·F. Monrabal·C. M. B. Monteiro·F. J. Mora·K. E. Navarro·D. R. Nygren·E. Oblak·I. Osborne·J. Palacio·B. Palmeiro·A. Para·I. Parmaksiz·A. Pazos·J. Pelegrin·M. Pérez Maneiro·I. Rivilla·C. Rogero·L. Rogers·B. Romeo·C. Romo-Luque·E. Ruiz-Chóliz·F. P. Santos·J. M. F. dos Santos·M. Seemann·I. Shomroni·A. L. M. Silva·P. A. O. C. Silva·S. R. Soleti
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Abstract

The NEXT-DEMO++ detector, a high-pressure xenon gas time projection chamber serving as a prototype for the NEXT-100 experiment, was used to measure the electroluminescence (EL) yield as a function of reduced electric field ($E/p$) across pressures from 2.0 to 9.4 bar, utilizing the 41.5 keV de-excitation peak of $^{83m}$Kr. These measurements were made to examine the pressure dependence of the slope of the reduced EL yield $Y/p$, which has shown inconsistencies in the literature. The reduced yield was fitted with a linear model, revealing a modest ($\sim$5%) change in slope, beginning around 5 bar and increasing with pressure up to 9.4 bar.

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NEXT Collaboration, J. Renner, J. D. Villamil, N. López-March, K. Mistry, P. Novella, A. Simón, V. Álvarez, J. M. Benlloch-Rodríguez, M. Cid, C. Cortes-Parra, R. Esteve, F. Kellerer, J. Martín-Albo, A. Martínez, G. Martínez-Lema, M. Martínez-Vara, M. Querol, P. Saharia, M. Sorel, S. Teruel-Pardo, H. Almazán, L. Arazi, I. J. Arnquist, F. Auria-Luna, S. Ayet, Y. Ayyad, C. D. R. Azevedo, F. Ballester, J. E. Barcelon, M. del Barrio-Torregrosa, F. I. G. M. Borges, A. Brodoline, N. Byrnes, A. Castillo, E. Church, X. Cid, C. A. N. Conde, F. P. Cossío, R. Coupe, E. Dey, P. Dietz, C. Echeverria, M. Elorza, R. Felkai, L. M. P. Fernandes, P. Ferrario, P. Ferrero Mancheño, F. W. Foss, Z. Freixa, J. García-Barrena, J. J. Gómez-Cadenas, J. W. R. Grocott, R. Guenette, J. Hauptman, C. A. O. Henriques, J. A. Hernando Morata, P. Herrero-Gómez, V. Herrero, C. Hervés Carrete, Y. Ifergan, A. F. B. Isabel, B. J. P. Jones, L. Larizgoitia, A. Larumbe, P. Lebrun, F. Lopez, R. Madigan, R. D. P. Mano, A. Marauri, A. P. Marques, R. L. Miller, J. Molina-Canteras, F. Monrabal, C. M. B. Monteiro, F. J. Mora, K. E. Navarro, D. R. Nygren, E. Oblak, I. Osborne, J. Palacio, B. Palmeiro, A. Para, I. Parmaksiz, A. Pazos, J. Pelegrin, M. Pérez Maneiro, I. Rivilla, C. Rogero, L. Rogers, B. Romeo, C. Romo-Luque, E. Ruiz-Chóliz, F. P. Santos, J. M. F. dos Santos, M. Seemann, I. Shomroni, A. L. M. Silva, P. A. O. C. Silva, S. R. Soleti. 2026-04-17. Electroluminescence Yield Measurements in Xenon Gas with the NEXT-DEMO++ Detector. https://arxiv.org/abs/2604.15905

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