Excess Noise in High-Current Diamond Diodes -- Physical Mechanisms and Implications for Reliability Assessment

Subhajit Ghosh; Harshad Surdi; Fariborz Kargar; Franz A. Koeck; Sergey Rumyantsev; Stephen Goodnick; Robert Nemanich; Alexander A. Balandin

doi:10.1063/5.0083383

arXiv · 2112.14695

Excess Noise in High-Current Diamond Diodes -- Physical Mechanisms and Implications for Reliability Assessment

Subhajit Ghosh·Harshad Surdi·Fariborz Kargar·Franz A. Koeck·Sergey Rumyantsev·Stephen Goodnick·Robert Nemanich·Alexander A. Balandin

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Abstract

We report results of an investigation of low-frequency excess noise in high-current diamond diodes. It was found that the electronic excess noise of the diamond diodes is dominated by generation - recombination noise, which reveals itself either as Lorentzian spectral features or as a 1/f noise spectrum (f is the frequency). The generation - recombination bulges are characteristic for diamond diodes with lower turn-on voltages. The noise spectral density dependence on forward current, I, reveals three distinctive regions in all examined devices - it scales as I^2 at the low (I<10 uA) and high (I>10 mA) currents, and, rather unusually, remain nearly constant at the intermediate current range. The characteristic trap time constants, extracted from the noise data, reveal a uniquely strong dependence on current. Interestingly, the performance of the diamond diodes improves with increasing temperature. The obtained results are important for development of noise spectroscopy-based approaches for device reliability assessment for the high-power diamond electronics.

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Subhajit Ghosh, Harshad Surdi, Fariborz Kargar, Franz A. Koeck, Sergey Rumyantsev, Stephen Goodnick, Robert Nemanich, Alexander A. Balandin. 2021-12-26. Excess Noise in High-Current Diamond Diodes -- Physical Mechanisms and Implications for Reliability Assessment. https://doi.org/10.1063/5.0083383

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