JUNO 20-inch PMT and electronics system characterization using large pulses of PMT dark counts at the Pan-Asia testing platform

Caimei Liu; Min Li; Narongkiat Rodphai; Zhimin Wang; Jun Hu; Nikolay Anfimov; Lei Fan; Alberto Garfagnini; Guanghua Gong; Shaojing Hou; Xiaolu Ji; Xiaoshan Jiang; Denis Korablev; Tobias Lachenmaier; Si Ma; Xiaoyan Ma; Zhe Ning; Alexander G. Olshevskiy; Zhaoyuan Peng; Zhonghua Qin; Tobias Sterr; Yunhua Sun; Alexander Felix Tietzsch; Jun Wang; Wei Wang; Yangfu Wang; Kaile Wen; Bjoern Soenke Wonsak; Wan Xie; Meihang Xu; Xiongbo Yan; Yifan Yang; Rong Zhao; Tong Zhou; Kejun Zhu; Jianmeng Dong; Pierre-Alexandre Petitjean; Barbara Clerbaux

arXiv · 2506.21179

JUNO 20-inch PMT and electronics system characterization using large pulses of PMT dark counts at the Pan-Asia testing platform

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Abstract

The main goal of the JUNO experiment is to determine the neutrino mass ordering with a 20kt liquid-scintillator detector. The 20-inch PMT and its 1F3 (one for three) electronics are crucial to realize the excellent energy resolution of at least 3% at 1MeV. The knowledge on the PMT and 1F3 electronics response is critical for detector performance understanding. A study of the JUNO 20-inch PMT and 1F3 electronics system characterization is presented using large pulses of PMT dark count at the Pan-Asia testing platform in China. Thanks to its broad amplitude range and high rate, the large pulse signals are also used to investigate the PMT after pulse response.

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Caimei Liu, Min Li, Narongkiat Rodphai, Zhimin Wang, Jun Hu, Nikolay Anfimov, Lei Fan, Alberto Garfagnini, Guanghua Gong, Shaojing Hou, Xiaolu Ji, Xiaoshan Jiang, Denis Korablev, Tobias Lachenmaier, Si Ma, Xiaoyan Ma, Zhe Ning, Alexander G. Olshevskiy, Zhaoyuan Peng, Zhonghua Qin, Tobias Sterr, Yunhua Sun, Alexander Felix Tietzsch, Jun Wang, Wei Wang, Yangfu Wang, Kaile Wen, Bjoern Soenke Wonsak, Wan Xie, Meihang Xu, Xiongbo Yan, Yifan Yang, Rong Zhao, Tong Zhou, Kejun Zhu, Jianmeng Dong, Pierre-Alexandre Petitjean, Barbara Clerbaux. 2025-06-26. JUNO 20-inch PMT and electronics system characterization using large pulses of PMT dark counts at the Pan-Asia testing platform. https://arxiv.org/abs/2506.21179

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